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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / Michael L. Bushnell, Vishwani D. Agrawal.
Material type:
TextSeries: Frontiers in electronic testing ; 17Publication details: Boston : Kluwer Academic, c2000.Description: xviii, 690 p. : ill. ; 24 cmISBN: - 0792379918
- 621.395 23 BUE
| Cover image | Item type | Current library | Home library | Collection | Shelving location | Call number | Materials specified | Vol info | URL | Copy number | Status | Notes | Date due | Barcode | Item holds | Item hold queue priority | Course reserves | |
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Quinlivan Library, Notre Dame University Bangladesh CSE Shelf 01 Row 06 B | Non-fiction | 621.395 BUE (Browse shelf(Opens below)) | 01 | Not For Loan | 007302 | ||||||||||||
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Book
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Quinlivan Library, Notre Dame University Bangladesh CSE Shelf 01 Row 06 B | Non-fiction | 621.395 BUE (Browse shelf(Opens below)) | 02 | Available | 007303 | ||||||||||||
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Book
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Quinlivan Library, Notre Dame University Bangladesh CSE Shelf 01 Row 06 B | Non-fiction | 621.395 BUE (Browse shelf(Opens below)) | 03 | Available | 007304 |
Includes bibliographical references and index.
CSE