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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / (Record no. 1343)

000 -LEADER
fixed length control field 01045cam a22002894a 4500
003 - CONTROL NUMBER IDENTIFIER
control field BD-DHNDQ
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20191113145442.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 000829s2000 maua b 001 0 eng
010 ## - LIBRARY OF CONGRESS CONTROL NUMBER
LC control number 00046212
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 0792379918
040 ## - CATALOGING SOURCE
Original cataloging agency DLC
Transcribing agency DLC
Modifying agency BD-DHNDQ
082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.395
Edition number 23
Item number BUE
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Bushnell, Michael L.
Fuller form of name (Michael Lee),
Dates associated with a name 1950-
245 10 - TITLE STATEMENT
Title Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /
Statement of responsibility, etc. Michael L. Bushnell, Vishwani D. Agrawal.
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. Boston :
Name of publisher, distributor, etc. Kluwer Academic,
Date of publication, distribution, etc. c2000.
300 ## - PHYSICAL DESCRIPTION
Extent xviii, 690 p. :
Other physical details ill. ;
Dimensions 24 cm.
440 #0 - SERIES STATEMENT
Series Title Frontiers in electronic testing ;
Volume/Sequential Designation 17
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc. note Includes bibliographical references and index.
526 ## - STUDY PROGRAM INFORMATION NOTE
Department/Subject name CSE
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Integrated circuits
General subdivision Very large scale integration
-- Testing.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Digital integrated circuits
General subdivision Testing.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Mixed signal circuits
General subdivision Testing.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Semiconductor storage devices
General subdivision Testing.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Agrawal, Vishwani D.,
Dates associated with a name 1943-
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme
Koha item type Book
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan Collection code Permanent Location Current Location Shelving location Date acquired Source of acquisition Cost, normal purchase price Full call number Barcode Date last seen Copy number Price effective from Koha item type
        Not For Loan Non-fiction Quinlivan Library, Notre Dame University Bangladesh Quinlivan Library, Notre Dame University Bangladesh CSE Shelf 02 Row 02 B 2019-11-12 Purchased 430.00 621.395 BUE 007302 2019-11-13 01 2019-11-13 Book
          Non-fiction Quinlivan Library, Notre Dame University Bangladesh Quinlivan Library, Notre Dame University Bangladesh CSE Shelf 02 Row 02 B 2019-11-12 Purchased 430.00 621.395 BUE 007303 2019-11-13 02 2019-11-13 Book
          Non-fiction Quinlivan Library, Notre Dame University Bangladesh Quinlivan Library, Notre Dame University Bangladesh CSE Shelf 02 Row 02 B 2019-11-12 Purchased 430.00 621.395 BUE 007304 2019-11-13 03 2019-11-13 Book
Last Updated on 5 July, 2022
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