| 000 | 01045cam a22002894a 4500 | ||
|---|---|---|---|
| 999 |
_c1343 _d1343 |
||
| 001 | 007302 | ||
| 003 | BD-DHNDQ | ||
| 005 | 20191113145442.0 | ||
| 008 | 000829s2000 maua b 001 0 eng | ||
| 010 | _a 00046212 | ||
| 020 | _a0792379918 | ||
| 040 |
_aDLC _cDLC _dBD-DHNDQ |
||
| 082 | 0 | 0 |
_a621.395 _223 _bBUE |
| 100 | 1 |
_aBushnell, Michael L. _q(Michael Lee), _d1950- |
|
| 245 | 1 | 0 |
_aEssentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / _cMichael L. Bushnell, Vishwani D. Agrawal. |
| 260 |
_aBoston : _bKluwer Academic, _cc2000. |
||
| 300 |
_axviii, 690 p. : _bill. ; _c24 cm. |
||
| 440 | 0 |
_aFrontiers in electronic testing ; _v17 |
|
| 504 | _aIncludes bibliographical references and index. | ||
| 526 | _aCSE | ||
| 650 | 0 |
_aIntegrated circuits _xVery large scale integration _xTesting. |
|
| 650 | 0 |
_aDigital integrated circuits _xTesting. |
|
| 650 | 0 |
_aMixed signal circuits _xTesting. |
|
| 650 | 0 |
_aSemiconductor storage devices _xTesting. |
|
| 700 | 1 |
_aAgrawal, Vishwani D., _d1943- |
|
| 942 |
_2ddc _cBK |
||