Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /
Michael L. Bushnell, Vishwani D. Agrawal.
- Boston : Kluwer Academic, c2000.
- xviii, 690 p. : ill. ; 24 cm.
- Frontiers in electronic testing ; 17 .
Includes bibliographical references and index.
0792379918
00046212
Integrated circuits--Very large scale integration--Testing. Digital integrated circuits--Testing. Mixed signal circuits--Testing. Semiconductor storage devices--Testing.